MT100 family of tester with its ranges of voltages and currents covers test requirement of static parameter from DIEs to complex configuration of modules. MT200 family add dynamic and combined parameters test that reach ranges up to 10 kV and 10 kA in the MT300 family, to satisfy strongest requirements of the market.
MT100
MT200
MT300
Fixture
Adapter
Technology
MT100
MT200
MT300
Fixture
Adapter
Technology
Power semiconductor
testers families
Power semiconductor testers families
MT100 family of tester with its ranges of voltages and currents covers test requirement of static parameter from DIEs to complex configuration of modules. MT200 family add dynamic and combined parameters test that reach ranges up to 10 kV and 10 kA in the MT300 family, to satisfy strongest requirements of the market.
Unique platform
for all products
Same user interface, low number of spare parts, reusable know-how for maintenance, upgradability with latest improvement requested by the market. All advantages that reduce operating costs and with unique fixture concept provide best performance and best flexibility from a power semiconductor test platform.
Unique platform for all products
Same user interface, low number of spare parts, reusable know-how for maintenance, upgradability with latest improvement requested by the market. All advantages that reduce operating costs and with unique fixture concept provide best performance and best flexibility from a power semiconductor test platform.
Best precision
measurements
Continuous work to satisfy top of the range devices test requirements let us improve our tester performance. Starting form low stray inductance, 18 nH thanks to our LSI™ technology, that allows devices under test to switch at maximum speed, up to the high resolution 12 bits waveform acquisition system for high measurement precision.
Best precision measurements
Continuous work to satisfy top of the range devices test requirements let us improve our tester performance. Starting form low stray inductance, 18 nH thanks to our LSI™ technology, that allows devices under test to switch at maximum speed, up to the high resolution 12 bits waveform acquisition system for high measurement precision.
Wafer, die, substrate, discrete
and module: same tester
Hot station for AC test, room temperature for DC, HIPOT for insulation, laser marking, pin check, planarity check, loading/unloading with sorting are samples of standardized functions available on test cell for module, discrete, substrate, die and wafer. Thanks to our partner, any new request becomes a new integrated option available in the test cells to be ready to provide solutions for tomorrow technological challenges.
Wafer, die, substrate, discrete and module: same tester
Hot station for AC test, room temperature for DC, HIPOT for insulation, laser marking, pin check, planarity check, loading/unloading with sorting are samples of standardized functions available on test cell for module, discrete, substrate, die and wafer. Thanks to our partner, any new request becomes a new integrated option available in the test cells to be ready to provide solutions for tomorrow technological challenges.
Software embedded
into the oscilloscope
Good signal acquisition thanks to Teledyne LeCroy HDO6000A 12bits 350MHz oscilloscope becomes good dynamic parameters measure thanks to CREA plug-in that carry out all the measures comply to IEC60747 standard in the shortest time.
Software embedded into the oscilloscope
Good signal acquisition thanks to Teledyne LeCroy HDO6000A 12bits 350MHz oscilloscope becomes good dynamic parameters measure thanks to CREA plug-in that carry out all the measures comply to IEC60747 standard in the shortest time.
Predefined test steps,
no coding required
No code writing needed to use the tester, no function call to manage the matrix and switches, just fulfil forms with your test parameters is needed to make a new test program. You can choose the step from a list of predefined tests written comply with IEC60747 standard.
Predefined test steps, no coding required
No code writing needed to use the tester, no function call to manage the matrix and switches, just fulfil forms with your test parameters is needed to make a new test test program. You can choose the step from a list of predefined tests written comply with IEC60747 standard.
Complete test cell,
production oriented
Our manual load/unloading integrated handlers use the same contacting tool (fixture) of automatic test cells for high volume production, to allow you setup new test program avoiding production stops.
Complete test cell, production oriented
Our manual load/unloading integrated handlers use the same contacting tool (fixture) of automatic test cells for high volume production, to allow you setup new test program avoiding production stops.
Production solutions
for high power devices
Application-oriented technologies, easy maintenance, standardized fixturing system, automation interface, high level user interface, short setup time, all to provide high performance low utilization cost test cells for production.
Production solutions
for high power devices
Application-oriented technologies, easy maintenance, standardized fixturing system, automation interface, high level user interface, short setup time, all to provide high performance low utilization cost test cells for production.