Hot station for AC test, room temperature for DC, HIPOT for insulation, laser marking, pin check, planarity check, loading/unloading with sorting are samples of standardized functions available on test cell for module, discrete, substrate, die and wafer. Thanks to our partner, any new request becomes a new integrated option available in the test cells to be ready to provide solutions for tomorrow technological challenges.

Low stray inductance LSI™ , probe card interface PCI™ , application-oriented technologies, a plus from CREA that added to our tester and our partner’s handlers guaranty turnkey solutions that satisfy your test needs.

LSI™ technology made us ready to test new module for hybrid automotive engines. PCI™ technology made us ready to test new chips for next generation high speed trains. We are ready to continue helping your technological grow and to support your production plan.

Application-oriented technologies, easy maintenance, standardized fixturing system, automation interface, high level user interface, short setup time, all to provide high performance low utilization cost test cells for production.