Strada Arrivore, 31 - 10154 Torino ITALY
tel. +39 11 246 21 47 - fax. +39 11 246 22 00
e-mail:info@crea-test.com
TEST | SEMICONDUCTOR | ELECTRONIC |MOSFET | POWER
test
by
CREA - SEMICONDUCTOR TEST EQUIPMENTS
how we test
The test is performed executing a testprogram file: it is composed by a sequence of steps (basic tests) on which the operator defines the parameters values, measure setting and PASS/FAIL or class selection conditions.
Typical tests performed are:
VF forward voltage drop test
IGT minimum gate current required to trigger test
VGT minimum gate voltage required to trigger test
IH minimum holding current test
IL minimum latching current test
VBLK blocking voltage test
ILK leakage current test
Surge surge test
Strada Arrivore, 31 - 10154 Torino ITALY
tel. +39 11 246 21 47 - fax. +39 11 246 22 00
e-mail:info@crea-test.com
TEST | SEMICONDUCTOR | ELECTRONIC |MOSFET | POWER