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Iges, Vgeth, Vceon, Vf,
Ices, bVces, Shunt measure,
Kelvin tests performed
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Currents up to 200A
and voltages up to 2kV
can be switched in a single run
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Up to 100 tests grouped in up to 30 steps
all in a single run
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Results collection,
exporting and statistical analysis
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Enhanced software speeds up data passing
between User Interface and Tester Controller
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Enhanced Testprogram editor features: the same
parameters set can apply to different junctions; Testprograms can
be checked and debugged.
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Flexible Testprogram:
test flow can be made dependent on partial results (Jump
on Pass/Fail)
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Classes can be defined upon test results using
the Matching editor.
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Waveform inspection
|
| General Features |
12bit bipolar reference generation and measurements.
Scalable 12bit Square Wave from 50m
s to 7ms, 10ms semisinusoidal or configurable trapesoidal wave.
Waveform inspection.
|
| High Current Generator |
100A, 1kA, ...up to 9kA full scale resolution
for current generation/measurement
± 10V or ± 1V
full scale for voltage drop measurement. |
| High Voltage Generator |
Up to 2kV; 50m
A, 500m A, 5mA,
50mA full scale resolution for current generation/measurement |
| Driver Gate |
Generator A |
Selectable 3V ¸
18V, 1V step Output Voltage
Selectable 0V / -15V off state |
| |
Generator B |
Current limited Voltage mode or Voltage
limited Current mode selectable
± 30V full scale,
10mA, 100mA, 1mA, 10mA,
100mA, 1A full scale. |
| Matrix |
Up to 20 power points, up to 20 power sense,
up to 20 gate-emitter pairs, up to 20 gate-emitter sense pairs.
Each device to test can be defined choosing Emitter, Emitter sense,
Cathode, Cathode sense, Gate-Emitter pair, Gate-Emitter sense pair.
Each Gate-Emitter pair not involved in actual test is shorted.
Kelvin Test can be individually enabled on each point. |
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