semiconductor test equipments

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POWER TEST SEMICONDUCTOR MOSFET ELECTRONIC

CREA s.n.c. Strada Arrivore, 31 10154 Turin (Italy)
tel +39 11 246 21 47 - fax +39 11 246 22 00

CREA was established on 1992, by a team of electronic designers with a long time experience in Automatic Test Equipments. The union of ATE philosophy and the long time experience spent inside the laboratories of semiconductors manufacturers, allow us to have today a special know how to develop semiconductor test systems for IGBT, MOSFET, SCR, DIODE and similar. We carry out a complete design including hardware, software, firmware, and mechanical parts; all the projects are our property. Today we offer the MT-system series, a modular testers family, synthesis of the testers produced in the past and the new HW and SW structure we developed to achieve higher modularity and growing capability, in order to satisfy a wide variety of test specifications and cost saving requirements. All CREA testers have two working environments: laboratory (password protected environment to define, debug and run testprograms, inspectable scope function, characterization oriented loops) and production (easy to use environment, exportable results collection and scope traces, labels and reports printout). The modular structure of the MT-system series allows to perform different kind of tests (static and dynamic tests, high currents, high voltages, gate parameters) in a single run, on single or multi device modules. The same tester can be configured to fit different module setups.

ATE

TRANSISTOR

SEMICONDUCTOR

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semiconductors, test, mosfet, IGBT,diode, SCR

The union of ATE philosophy and the long time experience spent inside the laboratories of semiconductors manufacturers, allow us to have today a special know how to develop semiconductor test systems for IGBT, MOSFET, SCR, DIODE and similar.

CREA designs and manufactures automatic testers for power semiconductors, ATE, modules, mosfet, IGBT,diode, SCR ,ISO 9000, ate, automatic test equipment,A.T.E., circuits, current, drain, dynamic, electronic, gate, igbt, mosfet, power, quality, semiconductor, semiconductors, silicon, static switching, test, tester, testing, transistor, transistors, triac, voltage, wafer,power semiconductor test,semiconductor testing equipments, silicon wafer test